SUBJECT:  
Cosmic-rays induced radiation effects in microelectronic devices

    
SUMMARY:

Single-event upsets (SEUs) induced by terrestrial cosmic-ray neutrons are recently recognized as one of key reliability concerns for microelectronic devices. It is necessary to integrate multi-physics (cosmic-ray physics, nuclear physics, radiation physics, and device physics) in order to enhance our understanding of the phenomena. We plan to apply a modern high-energy particle and heavy-ion transport code (PHITS code) to analyses of the SEUs in the present work.

REQUIREMENTS:

Programming on Lunix OS, knowledges on nuclear and radiation physics

PERIOD:
None

RESPONSIBLE PERSON:
(address, phone, fax)
 
 
 
 
 

Associate Prof. Yukinobu WATANABE

Affiliation: Department of Advanced Energy Engineering Science,
Kyushu University

Location: 6-1 Kasuga-koen, Kasuga, Fukuoka 816-8580, Japan

Email: watanabe@aees.kyushu-u.ac.jp